ATM_ID: D54DF36C-F01F-11ED-934A-1646AE03A09F MFF: PLANNEDTIMESTAFF: ID: (Trash)/WFAST_System_DiagGRSGen/Testcases/FS_08.250_IIT_Speed_Management/132173 TESTCASE_HEADLINE: {DY 5.3} Remove the Image Input Terminal (IIT) speed restriction (currently it is up to 160ipm) and allow it to scan at up to 270 duplex ipm (Letter/A4 at both 200 and 300 dpi) until the SIC scan buffers go full and then slow it to the Common Image Path Software (CIPS) processing speed (~160ipm@200dpi). Note: If the SIC scan buffers ever do go full, it is not a problem, it means only that our speed will then be tied directly to the speed of the ScanGraph. GROUP: FEATURE: SUB_FEATURE: INPUT: PROCEDURE: OUTPUT: PROCESS: PRIORITY: TEST_TYPE: manual LOE: RESOURCE_HW: RESOURCE_CONSUMEABLES: RESOURCE_MEDIA: SKILL_SET: TEST_CASE_TYPE: testcases TESTCASE_SOURCE: SPEC: SPEC_NUM: SPEC_VERSION: SPEC_TAG: 08.250.002 [FT-26713] ATM_OWNER: APPROVE_QE: APPROVED_QE: APPROVE_SE: APPROVED_SE: APPROVE_SPAR: APPROVED_SPAR: ASSOCIATED_TESTCASES: TRAINING: TESTCASE_VERSION: TESTCASE_STATE: TESTCASE_PLATFORM: TESTCASE_PRODUCT: TESTCASE_FAMILY: TESTCASE_APPROVALS: CDATE: 1683825503 MDATE: 1683825503, 1707743936 MUSER: Q44PY9XD, r72942DH AUTHOR: Q44PY9XD ATM_MCOMMENTS: Imported from spreadsheet, Moved to Trash. HISTORY: ATM_LOCKED: ATM_REQLINK: ATM_REQCOUNT: 0 QA_TEAM: TC_WEIGHTAGE: FILENAME: FILEDESC: FILES: RELEASE: COMPETENCY: wfast_system_diaggrsgen AUTOMATION_GROUP: TESTCASE_STEPS_ARE_RELATED_TO: REASON_FOR_AUTOMATABLE: PRECONDITION_TO_BE_DONE: ACTION_TO_BE_DONE: COMMON_FUNCTIONALITY: COMMONALITY_DETAILS: CONSTRAINTS_DAR: DEVELOPMENT_COMPLETE_TIME: PO_SIGNOFF_DATE: COMPLEXITY_PRECONDITIONS: COMPLEXITY_OUTPUT_VALIDATION: AUTOMATABLE: TESTCASE_MODIFICATION_REQUIRED: APTEST_UPDATE_STATUS: DEVICE_CATEGORY: TC_WORK_LOCATION_CAT: AUTOMATION_TC_VALIDATION: